For the physical characterization of particles Microtrac offers a range of optical particle analyzers. Microtrac is the only worldwide supplier of dynamic image analysis, static image analysis, laser diffraction and sieve analysis equipment with an extensive understanding of the strengths and weaknesses of each method.
| Dynamic Image Analysis (DIA) |
Static Image Analysis |
Sieve Analysis (Retsch) |
Laser Diffraction | Dynamic Light Scattering (DLS) |
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| Wide dynamic measurement range |  |
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| Reproducibility and repeatability | |
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| High resolution for narrow distributions | |
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| Particle shape analysis | |
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| Direct measurement technique | |
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| Reliable detection of oversized grains | |
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| Robust hardware, easy operation for routine analysis |
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| Analysis of individual particles | |
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| High measurement speed, short measurement times |
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| Analysis of nano particles | |
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| Analysis of Zeta potential and molecular weight |
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| Versatility | |
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| Measuring range | 0.8 µm - 135 mm | 0.5 µm – 1.5 mm | 10 µm - 125 mm | 10 nm – 5 mm | 0.8 nm - 6500 nm |
