White Paper: Correlation between sieve analysis and image analysis made easy

Dynamic Image Analysis (DIA) has become a widely used method for routineanalysis of particle size and particle shape in many industries. In this white paper we explain how traditional sieve analysis can successfully be replaced by DIA. The results produced by both techniques can be made to match so that product specifications based on sieve analysis remain unchanged. Users of image analysis benefit from reduced workload, higher sample throughput and more detailed results.

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